o Static Power: Power consumed when the circuit is powered ON but not actively switching. It's primarily due to leakage currents flowing through transistors that are supposed to be OFF.
o Main
Components: Subthreshold leakage, gate leakage, junction leakage.
o Factors:
Increases significantly with lower threshold voltages (Vt) and at smaller
technology nodes. Also increases with temperature.
o Dynamic
Power: Power consumed during the switching of logic states (when signals
transition between '0' and '1').
o Main
Components:
§ Switching
Power: Power needed to charge/discharge the load capacitance of gates and
interconnects (Psw=αCVdd2f). This is usually the dominant component.
§ Internal
(Short-Circuit) Power: Power consumed due to the brief direct path between
VDD and VSS when both PMOS and NMOS transistors are momentarily ON during input
transitions.
o Fixing/Reducing
Dynamic Power:
o Reduce
Voltage (Vdd): Most effective method due to the quadratic relationship
(Vdd2). Techniques include dynamic voltage scaling (DVS) or using multiple
voltage domains.
o Reduce
Frequency (f): Lowering the clock frequency directly reduces dynamic power.
Dynamic frequency scaling (DFS) can be used.
o Reduce
Switching Activity (α):
§ Clock
Gating:
§ Architectural/RTL
Optimization: Minimize unnecessary computations, choose efficient logic
structures.
o Reduce
Capacitance (C):
§ Cell
Sizing: Use smaller cells (lower drive strength) where timing permits, as
they have lower input capacitance.
§ Layout
Optimization: Shorter wire lengths reduce interconnect capacitance.
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