o Electromigration (EM): The gradual displacement and migration of metal atoms in an interconnect (wire or via) caused by the momentum transfer from flowing electrons. Over time, at high current densities and temperatures, this movement can lead to:
o Voids:
Depletion of metal atoms in a region, increasing resistance and potentially
causing an open circuit (wire break).
o Hillocks:
Accumulation of metal atoms in another region, potentially causing shorts to
adjacent wires.
o Increase
Wire Width: Widening the metal wire increases its cross-sectional area,
directly reducing the current density (J=I/Area). This is the most common fix
for wire EM. Often implemented using Non-Default Rules (NDRs).
o Add
Vias: For via EM violations (common due to small cross-section), increase
the number of via cuts in parallel between the connecting metal layers. This
provides multiple paths for current, reducing the density through any single
via cut.
o Layer
Promotion: Route the high-current net on higher metal layers. Top metal
layers are thicker, have lower resistance, and often have higher EM current
limits.
o Reduce
Wire Length: Shorter wires have less overall resistance and potentially
less susceptibility, though EM is primarily about density.
o Buffer
Insertion/Driver Downsizing: Inserting buffers can break a long net driven
by a single high-current driver into segments driven by smaller buffers,
potentially reducing peak currents in segments. Downsizing the driver cell
reduces the current it pushes
o Tool
to Check EM: EM analysis is performed by specialized Power Integrity and
Reliability analysis tools, often the same ones used for IR drop:
o Ansys
RedHawk-SC
o Cadence
Voltus
o Synopsys
PrimeSim Reliability Analysis (formerly PrimeSim EMIR)
o These
tools take inputs: the layout (DEF), parasitics (SPEF), current information
(from simulation VCD/FSDB or vectorless analysis), and technology EM rules
(often in the tech file or a separate rule deck)
o https://www.synopsys.com/glossary/what-is-electromigration.html
0 comments:
Post a Comment