· For power analysis, each cell's power dissipation has been characterized in the library (.lib) file. For leakage power, the EDA tool simply adds up the leakage power of each cell. (Note: Leakage power is usually state dependent) For dynamic power, the EDA tool either estimates net capacitance before P&R or calculates net capacitance after P&R. The designer has to provide the toggle rate. This can be based on educated guess, experience, simulation, or emulation.
·
IR Drop: it's the reduction in voltage
level along the power (VDD) and ground (VSS) distribution network (PDN) due to
the resistance (R) of the metal wires/vias and the current (I) flowing through
them (Vdrop=I×R). This means the voltage actually delivered to a standard cell
or macro's power pins is lower than the ideal supply voltage at the source
(pads/bumps).
·
Static IR Drop: The average
voltage drop across the PDN over time, calculated using the average
current drawn by the design components (primarily due to leakage current and
average switching activity). It uses the total power dissipation to calculate a
constant current draw. This current is then multiplied by the equivalent
resistance of the power network to arrive at the voltage drop
o Iavg
= leakage current + avg switching current.
o Avg
switching current can be calculated based on vectorless or with given switching
activity or vectors.
·
Dynamic IR Drop (Voltage Droop): The transient
or peak voltage drop that occurs due to sudden, high peak current
demands caused by many cells switching simultaneously (e.g., right after a
clock edge). This instantaneous drop can be significantly larger than the
static drop and is highly dependent on switching activity patterns and
decoupling capacitance effectiveness.
o No
two cells can experience same supply voltage, due to placement, nearby
activities thus each std cells have it’s unique dynamic voltage footprint.
o Cycle
to cylcle dynamic voltage variation depends on overall change in peak current,
Change in toggle rate of local cells.
·
Why Consider IR Drop?
o Performance
Impact: Reduced voltage at a cell's power pins increases its delay (cells
slow down). This can lead to setup violations and limit the maximum operating
frequency of the chip.
o Noise
Margin Reduction: Lower supply voltage reduces the noise margin of logic
gates, making them more susceptible to functional failures due to crosstalk or
other noise sources.
o Hold
Violations: Uneven IR drop across the chip can create local voltage
differences that effectively alter clock skew or data path delays in unexpected
ways, potentially causing hold violations.
o Functional
Failure: In severe cases, the voltage drop might be large enough that cells
fail to operate correctly or sequential elements lose their state (especially
critical in low-voltage designs).
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